Siemens - Elmo Diffraktometer 5000 /Kristalloflex

The D5000 can be used to determine the crystal structure of a material through X-ray diffraction. By directing an X-ray beam onto the sample, the D5000 measures the diffraction patterns that arise when the radiation is scattered by the atoms in the crystal lattice. These patterns are analyzed to obtain information about the arrangement of atoms in the crystal lattice.